更新日期 |
更新类型 |
更新内容 |
---|---|---|
2025-05-16 |
New device added |
增加 SA32B12GFF |
2025-05-16 |
New device added |
增加 CY8C4146AZI-T405 |
2025-05-16 |
Optimized |
定制 FM33FR054-HAIER |
2025-05-16 |
Optimized |
定制 FM33FH056-HAIER |
2025-05-16 |
Optimized |
定制 CY8C4025LQI模拟EEPROM |
2025-05-14 |
New device added |
增加ATMEL系列 G80F915AP@LQFP44 |
2025-05-14 |
New device added |
新增UM19A2LISW-D芯片 |
2025-05-14 |
New device added |
新增UM19A2HISW-D芯片 |
2025-05-14 |
New device added |
新增26G08DWSIG芯片 |
2025-05-14 |
New device added |
重新支持MT29F16G08ABACAWP芯片 |
2025-05-14 |
New device added |
增加SINOWEALTH系列 G80F915AP@LQFP44 |
2025-05-14 |
Optimized |
SC92F8411M EEPROM缓冲区初始值更改,该系列其他也一并修改 |
2025-05-13 |
Optimized |
XMC1402-T038X0064算法优化 |
2025-05-09 |
Optimized |
重写了烧录流程,BMI被改变后仍然可以校验芯片 |
2025-05-09 |
Optimized |
重写了烧录流程,BMI被改变后仍然可以校验芯片 |
2025-05-08 |
New device added |
增加SINOWEALTH系列 SH79F1627AP@LQFP32 |
2025-05-08 |
New device added |
增加SINOWEALTH系列 SH79F1617P@LQFP32 |
2025-05-06 |
New device added |
增加SINOWEALTH系列 SH79F3212M@SOP20 |
2025-05-06 |
New device added |
增加SINOWEALTH系列 SH79F9271M@SOP28 |
2025-05-06 |
New device added |
新增W25N01KWZEIG单头 |
2025-05-06 |
Optimized |
SC95F8767P48R EEPROM缓冲区初始值更改 |
2025-05-04 |
New device added |
新增ST M24M01-A125 |
2025-04-30 |
Bug fixed |
修正了IR3595A空片检测误报问题 |
2025-04-30 |
New device added |
新增S34ML04G300BHV00芯片 |
2025-04-30 |
New device added |
新增SC32F12GC8PJ芯片 |