更新日期

更新类型

更新内容

2025-05-09

Optimized

重写了烧录流程,BMI被改变后仍然可以校验芯片

2025-05-09

Optimized

重写了烧录流程,BMI被改变后仍然可以校验芯片

2025-05-08

New device added

增加SINOWEALTH系列 SH79F1627AP@LQFP32

2025-05-08

New device added

增加SINOWEALTH系列 SH79F1617P@LQFP32

2025-05-06

New device added

增加SINOWEALTH系列 SH79F3212M@SOP20

2025-05-06

New device added

增加SINOWEALTH系列 SH79F9271M@SOP28

2025-05-06

New device added

新增W25N01KWZEIG单头

2025-05-06

Optimized

SC95F8767P48R EEPROM缓冲区初始值更改

2025-04-30

Bug fixed

修正了IR3595A空片检测误报问题

2025-04-30

New device added

新增S34ML04G300BHV00芯片

2025-04-30

New device added

新增SC32F12GC8PJ芯片

2025-04-30

Others

修正了芯片名称

2025-04-29

New device added

新增MICROCHIP MCP19114/MCP19115

2025-04-29

New device added

新增MICROCHIP MCP19110/MCP19111

2025-04-29

New device added

新增DS35Q2GD-IB芯片

2025-04-29

New device added

新增UM19A2LISW单头

2025-04-29

New device added

新增UM19A2HISW单头

2025-04-29

New device added

新增DS35Q2GD(ID:E5 F2)芯片

2025-04-28

New device added

新增MT29F8G08ADADAH4多头

2025-04-28

New device added

新增SC32F10GS8PJ芯片

2025-04-27

New device added

新增FM35UQB001G-VWR芯片

2025-04-27

New device added

新增FM35SQB001G-VWR芯片

2025-04-27

New device added

新增MT29F8G08ADADAH4单头

2025-04-27

New device added

新增FM25LS04BI3芯片

2025-04-27

New device added

新增UM19A2HISW芯片